Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 12, Issue 4, 2004, Pages 395-407

  Shin, Seongkyun ^a   Eo, Yungseon ^a   Eisenstadt, William R ^b   Shim, Jongin ^a  

^a Hanyang University   (South Korea)

^b J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

Author keywords

Crosstalk; Delay; Glitch; Ringing; Signal integrity; Transmission line; Traveling wave; Traveling wave based waveform approximation (TWA); Very large scale integration (VLSI) interconnects

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; CAPACITANCE; EIGENVALUES AND EIGENFUNCTIONS; ELECTRIC LINES; ELECTRIC POWER SYSTEM INTERCONNECTION; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE;

DELAY; GLITCH; INTERCONNECT LINES; SIGNAL INTEGRITY; TRAVELING WAVE BASED WAVEFORM APPROXIMATION;

VLSI CIRCUITS;

EID: 2442641876     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2004.825836     Document Type: Conference Paper

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