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Volumn 37, Issue 3, 2002, Pages 394-403

Micromachined high-Q inductors in a 0.18-μm copper interconnect low-K dielectric CMOS process

Author keywords

CMOS micromachining; Modeling; Monolithic inductors; Quality factor; RFIC; Self resonance; Silicon integrated circuit technology; Substrate loss

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; COPPER; DIELECTRIC LOSSES; MICROMACHINING; NATURAL FREQUENCIES; RESONANCE; SUBSTRATES;

EID: 0036504120     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.987092     Document Type: Article
Times cited : (123)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.