|
Volumn 37, Issue 3, 2002, Pages 394-403
|
Micromachined high-Q inductors in a 0.18-μm copper interconnect low-K dielectric CMOS process
|
Author keywords
CMOS micromachining; Modeling; Monolithic inductors; Quality factor; RFIC; Self resonance; Silicon integrated circuit technology; Substrate loss
|
Indexed keywords
CAPACITANCE;
CMOS INTEGRATED CIRCUITS;
COPPER;
DIELECTRIC LOSSES;
MICROMACHINING;
NATURAL FREQUENCIES;
RESONANCE;
SUBSTRATES;
COPPER INTERCONNECTS;
ELECTRIC INDUCTORS;
|
EID: 0036504120
PISSN: 00189200
EISSN: None
Source Type: Journal
DOI: 10.1109/4.987092 Document Type: Article |
Times cited : (123)
|
References (30)
|