Disorder effects on infrared reflection spectra of InN films

Journal of Applied Physics

Volumn 95, Issue 9, 2004, Pages 4795-4801

  Thakur, J S ^a   Auner, G W ^a   Haddad, D B ^b   Naik, R ^b   Naik, V M ^c  

^a Wayne State University   (United States)

^b WAYNE STATE UNIVERSITY   (United States)

^c UNIVERSITY OF MICHIGAN DEARBORN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL POTENTIAL; PHONON DAMPING; PHONON ENERGIES; PLASMON DAMPING;

CARRIER CONCENTRATION; CRYSTAL SYMMETRY; DAMPING; INFRARED RADIATION; LIGHT TRANSMISSION; MATHEMATICAL MODELS; PHONONS; RAMAN SCATTERING; REFLECTION; SEMICONDUCTOR MATERIALS; SILICON; STOICHIOMETRY; SURFACE PHENOMENA;

INDIUM COMPOUNDS;

EID: 2442512182     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1690457     Document Type: Article

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