A study of current transport in (Bax Sr1-x) Ti1+yO3+z thin-film capacitors containing a voltage-dependent interface state charge distribution

Journal of Applied Physics

Volumn 97, Issue 11, 2005, Pages

  Baniecki, J D ^a   Shioga, T ^a   Kurihara, K ^a   Kamehara, N ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRAPPING; INTERFACE STATE CHARGE DISTRIBUTION; INTERFACIAL DIPOLE LAYERS; LIMITING VOLTAGES;

CAPACITORS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; FERROELECTRIC MATERIALS; INTERFACES (MATERIALS); THERMIONIC EMISSION; THIN FILM DEVICES;

THIN FILMS;

EID: 20544434356     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1872201     Document Type: Article

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