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Volumn 70, Issue 11, 2004, Pages

Junction lines of inversion domain boundaries with stacking faults in GaN

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM; NITROGEN DERIVATIVE;

EID: 19744382530     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.115331     Document Type: Article
Times cited : (12)

References (35)
  • 1
    • 4544350010 scopus 로고    scopus 로고
    • edited by R. K. Willardson and E. R. Weber (Academic Press, New York)
    • J. I. Pankove and T. D. Moustakas, in Semiconductors and Semimetals, edited by R. K. Willardson and E. R. Weber (Academic Press, New York, 1998), Vols. 50-57.
    • (1998) Semiconductors and Semimetals , pp. 50-57
    • Pankove, J.I.1    Moustakas, T.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.