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Volumn 5, Issue 1, 1997, Pages 35-46

Line Defects Separating Distinct Interfacial Structures: Topological Character and Diffusive Flux Considerations

Author keywords

Diffusive flux; Distinct structures; Interfacial dislocations

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DIFFUSION IN SOLIDS; DISLOCATIONS (CRYSTALS); MATHEMATICAL MODELS; VECTORS;

EID: 0030688733     PISSN: 09277056     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008646426894     Document Type: Article
Times cited : (16)

References (20)
  • 2
    • 0006012168 scopus 로고
    • Line Defects in Interfaces
    • In the Series edited by F.R.N. Nabarro Amsterdam: North Holand
    • R.C. Pond, Line Defects in Interfaces. In the Series Dislocations in Solids, edited by F.R.N. Nabarro (Amsterdam: North Holand, 1989), vol. 8, pp. 5-66.
    • (1989) Dislocations in Solids , vol.8 , pp. 5-66
    • Pond, R.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.