Charge accumulation at a threading edge dislocation in gallium nitride

Applied Physics Letters

Volumn 74, Issue 17, 1999, Pages 2495-2497

  Leung, K ^a   Wright, A F ^a   Stechel, E B ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b FORD MOTOR COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001576022     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123018     Document Type: Article

References (18)

1. S. D. Lester, F. A. Ponce, M. G. Craford, and D. A. Steigerwald, Appl. Phys. Lett. 66, 1249 (1995).
2. S. Nakamura, T. Mukai, and M. Senoh, Appl. Phys. Lett. 64, 1687 (1994); S. Nakamura, M. Senoh, N. Iwasa, and S. Nagahama, ibid. 67, 1868 (1995); S. Nakamura, M. Senoh, N. Iwasa, S. Nagahama, T. Yamada, and T. Mukai, Jpn. J. Appl. Phys., Part 2 34, L1332 (1995).
3. S. Nakamura, T. Mukai, and M. Senoh, Appl. Phys. Lett. 64, 1687 (1994); S. Nakamura, M. Senoh, N. Iwasa, and S. Nagahama, ibid. 67, 1868 (1995); S. Nakamura, M. Senoh, N. Iwasa, S. Nagahama, T. Yamada, and T. Mukai, Jpn. J. Appl. Phys., Part 2 34, L1332 (1995).
4. S. Nakamura, T. Mukai, and M. Senoh, Appl. Phys. Lett. 64, 1687 (1994); S. Nakamura, M. Senoh, N. Iwasa, and S. Nagahama, ibid. 67, 1868 (1995); S. Nakamura, M. Senoh, N. Iwasa, S. Nagahama, T. Yamada, and T. Mukai, Jpn. J. Appl. Phys., Part 2 34, L1332 (1995).
5. S. J. Rosner, E. C. Carr, M. J. Ludowise, G. Girolami, and H. I. Erikson, Appl. Phys. Lett. 70, 420 (1997); T. Sugahara, H. Sato, M. Hao, Y. Naoi, S. Kurai, S. Tottori, K. Yamashita, K. Nishino, L. T. Romano, and S. Sakai, Jpn. J. Appl. Phys., Part 2 37, L398 (1998).
6. S. J. Rosner, E. C. Carr, M. J. Ludowise, G. Girolami, and H. I. Erikson, Appl. Phys. Lett. 70, 420 (1997); T. Sugahara, H. Sato, M. Hao, Y. Naoi, S. Kurai, S. Tottori, K. Yamashita, K. Nishino, L. T. Romano, and S. Sakai, Jpn. J. Appl. Phys., Part 2 37, L398 (1998).
7. C. Youtsey, L. T. Romano, and I. Adesida, Appl. Phys. Lett. 73, 797 (1998).
8. P. J. Hansen, Y. E. Strausser, A. N. Erickson, E. J. Tarsa, P. Kozodoy, E. G. Brazel, J. P. Ibbetson, U. Mishra, V. Narayanamurti, S. P. DenBaars, and J. S. Speck, Appl. Phys. Lett. 72, 2247 (1998).
9. N. G. Weimann, L. F. Eastman, D. Doppalapudi, H. M. Ng, and T. D. Moustakas, J. Appl. Phys. 83, 3656 (1998); H. M. Ng, D. Doppalapui, T. D. Moustakas, N. G. Weimann, and L. F. Eastman, Appl. Phys. Lett. 73, 821 (1998).
10. N. G. Weimann, L. F. Eastman, D. Doppalapudi, H. M. Ng, and T. D. Moustakas, J. Appl. Phys. 83, 3656 (1998); H. M. Ng, D. Doppalapui, T. D. Moustakas, N. G. Weimann, and L. F. Eastman, Appl. Phys. Lett. 73, 821 (1998).
11. D. C. Look and J. R. Sizelove, Phys. Rev. Lett. 82, 1237 (1999).
12. 2 chemical potential used herein is shifted from the value in these publications by the difference between LDA and experimental chemical potentials. Note also that multipole interactions between charged cells are neglected within the LDA calculations.
13. 2 chemical potential used herein is shifted from the value in these publications by the difference between LDA and experimental chemical potentials. Note also that multipole interactions between charged cells are neglected within the LDA calculations.
14. Applied Simulated Annealing, edited by R. V. V. Vidal (Springer, Berlin, 1993).
15. G. Kresse and J. Hafner, Phys. Rev. B 47, 558 (1993); 49, 14251 (1994); G. Kresse and J. Furthmüller, ibid. 54, 11169 (1996).
16. G. Kresse and J. Hafner, Phys. Rev. B 47, 558 (1993); 49, 14251 (1994); G. Kresse and J. Furthmüller, ibid. 54, 11169 (1996).
17. G. Kresse and J. Hafner, Phys. Rev. B 47, 558 (1993); 49, 14251 (1994); G. Kresse and J. Furthmüller, ibid. 54, 11169 (1996).
18. W. T. Read, Philos. Mag. 45, 775 (1954).