Microstructure of planar defects and their interactions in wurtzite GaN films

Solid-State Electronics

Volumn 47, Issue 3, 2003, Pages 553-557

  Kioseoglou, J ^a   Komninou, Ph ^a   Dimitrakopulos, G P ^a   Kehagias, Th ^a   Polatoglou, H M ^a   Nouet, G ^b   Karakostas, Th ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b LABORATOIRE CRISMAT   (France)

Author keywords

Empirical potential; Gallium nitride; Interactions; Modeling; Planar defects

Indexed keywords

MICROSTRUCTURE; OPTOELECTRONIC DEVICES; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

PLANAR DEFECTS;

GALLIUM COMPOUNDS;

EID: 0037343569     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00412-4     Document Type: Conference Paper

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