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0026945514
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Dynamic measuring method of capacitance variation of piezoelectric ceramics with alternating electric field
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Development of nonlinear dielectric microscope and its application to measurement of ferroelectric polarization
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New microscope for measuring the distribution of nonlinear dielectric properties
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Scanning nonlinear dielectric microscope
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0031145439
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Scanning nonlinear dielectric microscope using a lumped constant resonator probe and its application to investigation of ferroelectric polarization distributions
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Cho Y., Atsumi S., and Nakamura K. Scanning nonlinear dielectric microscope using a lumped constant resonator probe and its application to investigation of ferroelectric polarization distributions. Jpn. J. Appl. Phys. 36 (1997) 3152-3156
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0032068903
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Scanning nonlinear dieletric microscopy with submicron resolution
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Scanning nonlinear dielectric microscopy with nanometer resolution
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0033745742
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Scanning electron-beam dielectric microscopy for the investigation of the temperature coefficient distribution of dielectric ceramics
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11
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0033705738
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Quantitative measurement of linear and nonlinear dielectric characteristic using scanning nonlinear dielectric microscopy
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Cho Y., Kazuta S., Ohara K., and Odagawa H. Quantitative measurement of linear and nonlinear dielectric characteristic using scanning nonlinear dielectric microscopy. Jpn. J. Appl. Phys. 39 (2000) 3086-3089
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Higher order nonlinear dielectric microscopy
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0035327801
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New functions of scanning nonlinear dielectric microscopy~higher-order measurement and vertical resolution~
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Cho Y., Ohara K., Koike A., and Odagawa H. New functions of scanning nonlinear dielectric microscopy~higher-order measurement and vertical resolution~. Jpn. J. of Appl. Phys. 40 (2001) 3544-3548
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7044233652
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Ferroelectric domain characterization and manipulation: a challenge for scanning probe microscopy
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15
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0033545055
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Nanoscale reconstruction of surface crystallography from three-dimensional polarization distribution in ferroelectric barium-titanate ceramics
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16
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0000769683
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High special resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope
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Fundamental study on nano domain engineering using scanning nonlinear dielectric microscopy
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Matsuura K., Cho Y., and Odagawa H. Fundamental study on nano domain engineering using scanning nonlinear dielectric microscopy. Jpn. J. Appl. Phys. 40 (2001) 4354-4356
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Measurement of the ferroelectric domain distributions using nonlinear dielectic response and piezoelectric response
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Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy
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Odagawa H., and Cho Y. Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy. Surface Science 463 (2000) L621-L625
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Surface Science
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Theoretical and experimental study on nanoscale ferroelectric domain measurement using scanning nonlinear dielectric microscopy
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Odagawa H., and Cho Y. Theoretical and experimental study on nanoscale ferroelectric domain measurement using scanning nonlinear dielectric microscopy. Jpn. J. Appl. Phys. 39 (2000) 5719-5722
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Measuring ferroelectric polarization component parallel to the surface by scanning nonlinear dielectric microscopy
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Odagawa H., and Cho Y. Measuring ferroelectric polarization component parallel to the surface by scanning nonlinear dielectric microscopy. Appl. Phys. Lett. 80 (2002) 2159-2161
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0035455317
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Fundamental study of surface layer on ferroelectrics by scanning nonlinear dielectric microscopy
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Ohara K., and Cho Y. Fundamental study of surface layer on ferroelectrics by scanning nonlinear dielectric microscopy. Jpn. J. Appl. Phys. 40 (2001) 5833-5836
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0036657151
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Quantitative measurement of linear dielectric, constant using scanning nonlinear dielectric microscopy with electro-conductive cantilever
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Ohara K., and Cho Y. Quantitative measurement of linear dielectric, constant using scanning nonlinear dielectric microscopy with electro-conductive cantilever. Jpn. J. Appl. Phys. 41 (2002) 4961-4964
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