Scanning nonlinear dielectric microscope using a lumped constant resonator probe and its application to investigation of ferroelectric polarization distributions

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 5 SUPPL. B, 1997, Pages 3152-3156

  Cho, Yasuo ^a   Atsumi, Shigeyuki ^a   Nakamura, Kiyoshi ^b  

^a YAMAGUCHI UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Lumped constant resonator probe; Scanning nonlinear dielectric microscope

Indexed keywords

LUMPED CONSTANT RESONATOR PROBE; SCANNING NONLINEAR DIELECTRIC MICROSCOPE;

FERROELECTRIC DEVICES; LUMPED PARAMETER NETWORKS; PROBES; RESONATORS;

ACOUSTIC MICROSCOPES;

EID: 0031145439     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.3152     Document Type: Article

References (14)

1. J. F. Scott and C. A. P. Araujo: Science 246 (1989) 1400.
2. J. T. Evance and R. Womack: J. Solid State Circuits 23 (1988) 1171.
3. J. M. Benedetto, R. A. Moore and F. B. McLean: Proc. 3rd Int. Symp. Integrated Ferroelectrics, Colorado Springs (1991) p. 44.
4. N. Abt: Proc. 3rd Int Symp. Integrated Ferroelectrics, Colorado Springs (1991) p. 404.
5. J. M. Benedetto, R. A. Moore and F. B. McLean: J. Appl. Phys. 75 (1994) 460.
6. T. Mihara, H. Watanabe, C. A. Araujo, J. Cuchiaro, M. Scott and L. D. McMillan: Proc. 4th Int. Symp. Integrated Ferroelectrics, Monterey (1992) p.137.
7. K. Takata, K. Kushida, K. Torii and H. Miki: Jpn. J. Appl. Phys. 33 (1994) 3193.
8. R. Gerhard-Multhaupt: Opt. Lett. 20 (1995) 816.
9. Y. Xu: Ferroelectric Materials and Their Applications (North-Holland, Amsterdam, 1991).
10. F. Freund, F. Battllo and M. Freund: Spectroscopic Characterization of Materials and Their Surface, eds. L. Cotne, S. McKeever and D. Blake (American Chemical Society, Washington, DC, 1990).
11. F. Freund, M. Freund and F. Battllo: J. Geophys. Res. 98 (1993) 2209.
12. Y. Cho, A. Kirihara and T. Saeki: Trans. Inst. Electron. Inf. & Commun. Eng. J78-C (1995) 593 [in Japanese].
13. Y. Cho, A. Kirihara and T. Saeki: Rev. Sci.Instrum. 67 (1996) 2297.
14. Y. Cho and F. Matsuno: Jpn. J. Appl. Phys. 31 (1992) 3627.