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Volumn 222, Issue 1-4, 1999, Pages 153-162

Ferroelectric domain characterisation and manipulation : A challenge for scanning probe microscopy

Author keywords

3 dimensional polarisation mapping; Atomic resolution; Domain switching; Ferroelectric domains and domain walls; Nanoscale hysteresis; Scanning probe microscopy

Indexed keywords


EID: 7044233652     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199908014811     Document Type: Article
Times cited : (68)

References (52)
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    • TopoLith software is provided by Paul Bucher Comp., Basel, Switzerland
    • TopoLith software is provided by Paul Bucher Comp., Basel, Switzerland,


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