New functions of scanning nonlinear dielectric microscopy - Higher-order measurement and vertical resolution

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 5 B, 2001, Pages 3544-3548

  Cho, Y ^a   Ohara, K ^a   Koike, A ^a   Odagawa, H ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Nonlinear dielectric constant; Scanning nonlinear dielectric microscopy; Scanning probe microscopy

Indexed keywords

CAPACITANCE; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; PERMITTIVITY MEASUREMENT; POLYNOMIALS; SENSORS;

SCANNING NONLINEAR DIELECTRIC MICROSCOPY (SNDM);

IMAGING TECHNIQUES;

EID: 0035327801     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.3544     Document Type: Article

References (7)