Scanning electron-beam dielectric microscopy for the investigation of the temperature coefficient distribution of dielectric ceramics

Journal of the American Ceramic Society

Volumn 83, Issue 5, 2000, Pages 1299-1301

  Cho, Yasuo ^a   Jintsugawa, Osamu ^a   Yamanouchi, Kazuhiko ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; COMPOSITION; DIELECTRIC MATERIALS; ELECTRON BEAMS; NUMERICAL METHODS; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DISTRIBUTION; TITANIUM DIOXIDE;

ELECTRON PROBE MICROANALYZER; SCANNING ELECTRON BEAM DIELECTRIC MICROSCOPY; TEMPERATURE COEFFICIENT DISTRIBUTION;

CERAMIC MATERIALS;

EID: 0033745742     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2000.tb01375.x     Document Type: Article

References (7)

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2. Y. Cho and T. Kumamaru, "Photothermal Dielectric Spectroscopic Microscope," Rev. Sci. Instrum., 67, 19-28 (1996).
3. Y. Cho and T. Kumamaru, "Photothermal Dielectric Effect with Liquid," Jpn. J. Appl. Phys., 35, 2907-91 (1996).
4. Y. Cho and T. Kumamaru, "Observation of Photothermal Dielectric Signal for Powder," Jpn. J. Appl. Phys., 36, 3303-304 (1997).
5. 2 Ceramics," Am. Ceram. Soc. Bull., 66, 1405-10 (1987).
6. 3 Dielectric Resonator," Jpn. J. Appl. Phys., 32, 4584-88 (1993).
7. A. Rosencwaig and A. Gersho, "Theory of the Photoacoustic Effect with Solids," J. Appl. Phys., 47, 64-69 (1976).