Fundamental study on nano domain engineering using scanning nonlinear dielectric microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 6 B, 2001, Pages 4354-4356

  Matsuura, K ^a   Cho, Y ^a   Odagawa, H ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Concentration of electric field under the tip; Engineered small ferroelectric domains; Nonlinear dielectric response; Piezoelectric response; Scanning nonlinear dielectric microscopy

Indexed keywords

FERROELECTRIC THIN FILMS; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; PERMITTIVITY; PIEZOELECTRICITY;

PIEZOELECTRIC RESPONSE IMAGING METHODS; SCANNING NONLINEAR DIELECTRIC MICROSCOPY (SNDM);

FERROELECTRIC DEVICES;

EID: 0035357447     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.4354     Document Type: Article

References (4)