Theoretical and experimental study on nanoscale ferroelectric domain measurement using scanning nonlinear dielectric microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 9 B, 2000, Pages 5719-5722

  Odagawa, Hiroyuki ^a   Cho, Yasuo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; LEAD COMPOUNDS; MORPHOLOGY; NUMERICAL ANALYSIS; PERMITTIVITY; POLARIZATION; SURFACES; THIN FILMS;

LEAD ZIRCONATE TITANATE; NANOSCALE FERROELECTRIC DOMAIN MEASUREMENT; SCANNING NONLINEAR DIELECTRIC MICROSCOPY;

FERROELECTRIC MATERIALS;

EID: 0034262562     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.5719     Document Type: Article

References (11)

1. Y. Cho, A. Kirihara and T. Sacki: Denshi Joho Tsushin Gakkai Ronbunshi 78-c-1 (1995) 593 [in Japanese].
2. Y. Cho, A. Kirihara and T. Saeki: Electron. & Commun. Jpn. Part 2, 79 (1996) 68.
3. Y. Cho, A. Kirihara and T. Saeki: Rev. Sci. Instrum. 67 (1996) 2297.
4. Y. Cho, S. Kazuta and K. Matsuura: Jpn. J. Appl. Phys. 38 (1999) 5689.
5. Y. Cho, S. Kazuta and K. Matsuura: Appl. Phys. Lett. 75 (1999) 2833.
6. A. Gruverman, O. Auciello, R. Ramesh and H. Tokumoto: Nanotechnology 8 (1997) A38.
7. J. Tersoft and D. R. Hainan: Phys. Rev. B31 2 (1985) 805.
8. C. Gao, T. Wei, F. Lu and D. Xiang: Appl. Phys. Lett. 71 (1997) 1872.
9. Y. Cho, S. Kazuta, K. Ohara and H. Odagawa: Jpn. J. Appl. Phys. 39 (2000) 3086.
10. K. Goto and S. Yamasaki: Denjikigaku Enshu (Exercise in Electromagnetic Theory) (Kyoritsu Shuppan, Tokyo, 1970) p. 123 [in Japanese].
11. H. Odagawa and Y. Cho: Jpn. J. Appl. Phys. 39 (2000) 3808.