Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 5 B, 2000, Pages 3086-3089

  Cho, Yasuo ^a   Kazuta, Satoshi ^a   Ohara, Koya ^a   Odagawa, Hiroyuki ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Linear dielectric constant; Nonlinear dielectric constant; Quantitative measurement; Scanning nonlinear dielectric microscopy

Indexed keywords

CAPACITANCE; COMPUTATIONAL METHODS; ELECTRIC FIELD EFFECTS; MICROSCOPIC EXAMINATION; SCANNING;

SCANNING NONLINEAR DIELECTRIC MICROSCOPY (SNDM);

PERMITTIVITY MEASUREMENT;

EID: 0033705738     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3086     Document Type: Article

References (11)

1. Y. Cho, A. Kirihara and T. Saeki: Denshi Joho Tsushin Gakkai Ronbunshi 78-c-l (1995) 593.[in Japanese].
2. Y. Cho, A. Kirihara and T. Sacki: Electronics and Communication in Japan (ScriptaTechnica, Inc., 1996) Part 2, Vol. 79, p. 68.
3. Y. Cho, A. Kirihara and T. Saeki: Rev. Sci. Instrum. 67 (1996) 2297.
4. Y. Cho. S. Atsumi and K. Nakamura: Jpn. J. Appl. Phys. 36 (1998) 3152.
5. Y. Cho: Oyo Buturi 67 (1998) 327 [in Japanese].
6. Y. Cho, K. Matsuura and J. Kushibiki: Jpn. J. Appl. Phys. 37 (1998) 3132.
7. Y. Cho, K. Matsuura, S. Kazuta, H. Odagawa and K. Yamanouchi: Jpn. J. Appl. Phys. 38 (1999) 3279.
8. Y. Cho, S. Kazuta and K. Matsuura: Jpn. J. Appl. Phys. 38 (1999) 5689.
9. Y. Cho, S. Kazuta and K. Matsuura: Appl. Phys. Lett. 75 (1999) 2833.
10. K. Goto and S. Yamasaki: Denjikigaku Enshuu (Exercises in Electromagnetic Theory) (Kyoritsu Shuppan, Tokyo, 1970) p. 123 [in Japanese].
11. Y. Cho and F. Matsuno: Jpn. J. Appl. Phys. 31 (1992) 3627.