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Volumn 79, Issue 6, 1996, Pages 68-75
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New microscope for measuring the distribution of nonlinear dielectric properties
a,b,c,d a a |
Author keywords
Ferroelectric materials; Microscope; Nonlinear dielectric constant; Piezoelectric materials
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Indexed keywords
CERAMIC MATERIALS;
CRYSTALLIZATION;
FERROELECTRIC MATERIALS;
PERMITTIVITY;
PIEZOELECTRIC MATERIALS;
POLARIZATION;
NONLINEAR PERMITTIVITY;
MICROSCOPES;
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EID: 0030164519
PISSN: 8756663X
EISSN: None
Source Type: Journal
DOI: 10.1002/ecjb.4420790608 Document Type: Article |
Times cited : (10)
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References (5)
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