Measuring ferroelectric polarization component parallel to the surface by scanning nonlinear dielectric microscopy

Applied Physics Letters

Volumn 80, Issue 12, 2002, Pages 2159-2161

  Odagawa, Hiroyuki ^a   Cho, Yasuo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED MEASUREMENT TECHNIQUES; FERROELECTRIC POLARIZATION; MATERIAL NONLINEAR; NONLINEAR DIELECTRIC; POLARIZATION VECTORS; SCANNING NONLINEAR DIELECTRIC MICROSCOPY;

ELECTRIC FIELDS; FERROELECTRIC MATERIALS; FERROELECTRICITY; POLARIZATION; PROBES; SURFACES;

DIELECTRIC DEVICES;

EID: 79956008561     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1463707     Document Type: Article

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