Scanning near-field optical microscopy based on the heterodyne phase-controlled oscillator method

Journal of Applied Physics

Volumn 88, Issue 5, 2000, Pages 2921-2927

  Shubeita, G T ^a   Sekatskii, S K ^a   Riedo, B ^a   Dietler, G ^a   Durig U ^b  

^a UNIVERSITY OF LAUSANNE   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

NATURAL FREQUENCIES; OPTICAL HETERODYNING; Q FACTOR MEASUREMENT; QUALITY CONTROL; TOPOGRAPHY;

DETECTION SCHEME; DISSIPATIVE INTERACTION; DYNAMIC FORCE MICROSCOPES; HETERODYNE PHASE-CONTROLLED OSCILLATORS; RESONANCE FREQUENCIES; SLIDING MECHANISM; TIP-SAMPLE INTERACTION; VIBRATION AMPLITUDE;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 12444298373     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.1287234     Document Type: Article

References (31)

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