Shear force distance control in near-field optical microscopy: Experimental evidence of the frictional probe-sample interaction

Ultramicroscopy

Volumn 83, Issue 1-2, 2000, Pages 17-23

  Lapshin, D A ^a   Kobylkin, E E ^a   Letokhov, V S ^a  

^a INSTITUTE OF SPECTROSCOPY   (Russian Federation)

Author keywords

Scanning near field optical microscopy; Shear force distance control

Indexed keywords

CONDUCTIVE MATERIALS; ELECTRIC CURRENT MEASUREMENT; FRICTION; MATHEMATICAL MODELS; SCANNING; SHEAR STRESS; SPATIAL VARIABLES CONTROL; VIBRATIONS (MECHANICAL);

FRICTION MODEL; QUASICONSTANT CURRENT; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SHEAR FORCE DISTANCE CONTROL;

OPTICAL MICROSCOPY;

ARTICLE; CALIBRATION; CONDUCTANCE; FORCE; FRICTION; POSITION; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SHEAR RATE; SURFACE PROPERTY;

EID: 0034077886     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00169-2     Document Type: Article

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