Contact mode near-field microscope

Ultramicroscopy

Volumn 76, Issue 1-2, 1999, Pages 13-20

  Lapshin, D A ^a   Reshetov, V N ^b   Sekatskii, S K ^a   Letokhov, V S ^a  

^a INSTITUTE OF SPECTROSCOPY   (Russian Federation)

^b NATIONAL RESEARCH NUCLEAR UNIVERSITY MEPHI   (Russian Federation)

Author keywords

Contact technique; Scanning near field optical microscopy

Indexed keywords

ARTICLE; DIFFRACTION; MICROSCOPE; PIEZOELECTRICITY; SCANNING TUNNELING MICROSCOPY; SENSOR; TECHNIQUE;

EID: 0032973434     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00066-7     Document Type: Article

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