Experimental study of probe-surface interaction in near-field optical microscopy

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 177-182

  Smolyaninov, Igor I ^a   Atia, Walid A ^a   Pilevar, Saeed ^a   Davis, Christopher C ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Near field microscopy; Shear force distance control

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRIC RESISTANCE; PROBES; SURFACES;

NEAR FIELD OPTICAL MICROSCOPY; PROBE SURFACE INTERACTION; SHEAR FORCE DISTANCE CONTROL;

OPTICAL MICROSCOPY;

ARTICLE; FORCE; OPTICS; SCANNING NEAR FIELD OPTICAL MICROSCOPY; VIBRATION;

EID: 0032033826     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00098-3     Document Type: Article

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