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Volumn 194, Issue 2-3, 1999, Pages 445-447

Interactions between hydrophobic and hydrophilic silicon surfaces using a tapered probe in near-field scanning optical microscopy

Author keywords

Elastic force; Hydrophilic; Hydrophobic; Shear force interactions; Silicon; Viscous force

Indexed keywords

HYDROFLUORIC ACID; HYDROPHILICITY; HYDROPHOBICITY; PROBES; SILICON COMPOUNDS; SURFACE CHEMISTRY;

EID: 0033059067     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00530.x     Document Type: Conference Paper
Times cited : (3)

References (7)
  • 1
    • 21544436741 scopus 로고
    • Combined shear force and near-field scanning optical microscopy
    • Betzig, E., Finn, P.L. & Weiner, J.S. (1992) Combined shear force and near-field scanning optical microscopy. Appl. Phys. Lett. 60, 2484-2486.
    • (1992) Appl. Phys. Lett. , vol.60 , pp. 2484-2486
    • Betzig, E.1    Finn, P.L.2    Weiner, J.S.3
  • 2
    • 3743151120 scopus 로고
    • Near field optics: Microscopy, spectroscopy and surface modification beyond the diffraction limit
    • Betzig, E. & Trautman, J.K. (1992) Near field optics: microscopy, spectroscopy and surface modification beyond the diffraction limit. Science, 257, 189-195.
    • (1992) Science , vol.257 , pp. 189-195
    • Betzig, E.1    Trautman, J.K.2
  • 3
    • 0022662543 scopus 로고
    • Investigations on hydrophilic and Hydrophobic silicon (100) wafer surfaces by X-ray photoelectron and high-resolution electron energy loss spectroscopy
    • Grundner, M. & Jacob, H. (1986) Investigations on hydrophilic and Hydrophobic silicon (100) wafer surfaces by X-ray photoelectron and high-resolution electron energy loss spectroscopy. Appl. Phys. A, 39, 73-82.
    • (1986) Appl. Phys. A , vol.39 , pp. 73-82
    • Grundner, M.1    Jacob, H.2
  • 5
    • 21544443037 scopus 로고
    • Near-field differential scanning optical microscope with atomic force regulation
    • Toledo-Crow, R., Yang, P.C., Chen, Y. & Vaez-Iravani, M. (1992) Near-field differential scanning optical microscope with atomic force regulation. Appl. Phys. Lett. 60, 2957-2959.
    • (1992) Appl. Phys. Lett. , vol.60 , pp. 2957-2959
    • Toledo-Crow, R.1    Yang, P.C.2    Chen, Y.3    Vaez-Iravani, M.4
  • 6
    • 0000421384 scopus 로고
    • Direct measurements of true vibrational amplitude in shear force microscopy
    • Wei, C.C., Wei, P.K. & Fann, W.S. (1995) Direct measurements of true vibrational amplitude in shear force microscopy. Appl. Phys. Lett. 67, 3835-3837.
    • (1995) Appl. Phys. Lett. , vol.67 , pp. 3835-3837
    • Wei, C.C.1    Wei, P.K.2    Fann, W.S.3
  • 7
    • 0001639302 scopus 로고    scopus 로고
    • The probe dynamics under shear force in near-field scanning optical microscopy
    • Wei, P.K. & Fann, W.S. (1998) The probe dynamics under shear force in near-field scanning optical microscopy. J. Appl. Phys. 83, 3461-3468.
    • (1998) J. Appl. Phys. , vol.83 , pp. 3461-3468
    • Wei, P.K.1    Fann, W.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.