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Volumn 150, Issue 12, 2003, Pages

Sensitive copper detection in P-type CZ silicon using μPCD

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; HIGH INTENSITY LIGHT; NUCLEATION; PHOTOCONDUCTIVITY; PRECIPITATION (CHEMICAL); SEMICONDUCTING SILICON;

EID: 0345759675     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1624845     Document Type: Article
Times cited : (32)

References (26)
  • 15
    • 0346543657 scopus 로고    scopus 로고
    • D. C. Gupta, F. R. Bacher, and W. M. Hughes, Editors; ASTM STP 1304, West Conshohocken, PA
    • C. Swiatkowski, Recombination Lifetime Measurements in Silicon, D. C. Gupta, F. R. Bacher, and W. M. Hughes, Editors, p. 80 ASTM STP 1304, West Conshohocken, PA (1998).
    • (1998) Recombination Lifetime Measurements in Silicon , pp. 80
    • Swiatkowski, C.1
  • 16
  • 24
    • 0001271236 scopus 로고    scopus 로고
    • D. C. Gupta, F. R. Bacher, and W. M. Hughes, Editors; ASTM STP 1304, West Conshohocken, PA
    • M. Miyazaki, Recombination Lifetime Measurements in Silicon, D. C. Gupta, F. R. Bacher, and W. M. Hughes, Editors, p. 294 ASTM STP 1304, West Conshohocken, PA (1998).
    • (1998) Recombination Lifetime Measurements in Silicon , pp. 294
    • Miyazaki, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.