SNOM/STM using a tetrahedral tip and a sensitive current-to-voltage converter

Journal of Microscopy

Volumn 202, Issue 1, 2001, Pages 53-59

  Heimel, J ^a   Fischer, U C ^a   Fuchs, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Current to voltage converter; Dye monolayer; Nanostructures; Near field; Scanning near field optical microscopy; Scanning tunnelling microscopy; Self assembly; SNOM; STM

Indexed keywords

NANOSTRUCTURES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY;

CURRENT TO VOLTAGE CONVERTERS; CURRENT-TO-VOLTAGE CONVERTERS; DYE MONOLAYER; METALLIC SAMPLES; MICROSCOPE SCANNING; NEAR FIELDS; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SET-UPS; TRANSMISSION MODE;

MONOLAYERS;

METAL COMPLEX;

CONFERENCE PAPER; ELECTRIC POTENTIAL; OPTICAL RESOLUTION; PRIORITY JOURNAL; REFLECTOMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY; STRUCTURE ANALYSIS; TOPOGRAPHY;

EID: 0035028619     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00861.x     Document Type: Conference Paper

References (9)

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