Resolution test for apertureless near-field optical microscopy

Journal of Applied Physics

Volumn 91, Issue 5, 2002, Pages 3363-3368

  Martin, Yves C ^a   Wickramasinghe, H Kumar ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33845423648     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1431430     Document Type: Article

References (26)

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19. Some degradation of the tip ends occurred during setup and tip approach, partly due to thermal instability on the scale of a few nanometer. The resulting tip diameter was always 5 nm or larger (as observed by AFM of one tip over the other), which is substantially larger than the best tip radius available, on the order of 2 nm. We believe that our measurement of resolution is limited by the diameter of the tips, and that better results can be achieved if tips are kept undamaged.
20. EMFLEX by Weidlinger Associates Inc., Los Altos, CA.
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25. One silicon tip and one nickel tip were used in this demonstration. Some degradation of the tip sharpness, due to small crashes during experiments, account for the larger near-field spot seen in these images.
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