-
1
-
-
0003253810
-
Germanium silicon: Physics and materials
-
R.K. Willadson, WeberE.R. San-Diego: Academic Press
-
Hull R., Bean J.C. Germanium Silicon. physics and materials Willadson R.K., Weber E.R. Semiconductors and Semimetals. Vol. 56:1999;Academic Press, San-Diego.
-
(1999)
Semiconductors and Semimetals
, vol.56
-
-
Hull, R.1
Bean, J.C.2
-
5
-
-
0036498730
-
-
Hartmann J.M., Loup V., Rolland G., Holliger P., Laugier F., Vannuffel C., Séméria M.N. J. Crystal Growth. 236:2002;10.
-
(2002)
J. Crystal Growth
, vol.236
, pp. 10
-
-
Hartmann, J.M.1
Loup, V.2
Rolland, G.3
Holliger, P.4
Laugier, F.5
Vannuffel, C.6
Séméria, M.N.7
-
6
-
-
0036566506
-
-
Hartmann J.M., Champay F., Loup V., Rolland G., Séméria M.N. J. Crystal Growth. 241:2002;93.
-
(2002)
J. Crystal Growth
, vol.241
, pp. 93
-
-
Hartmann, J.M.1
Champay, F.2
Loup, V.3
Rolland, G.4
Séméria, M.N.5
-
11
-
-
22844455259
-
-
Raajmakers I.J., Sprey H., Storm A., Bergman T., Italiano J., Meyer D. J. Vac. Sci. Technol. B. 17:1999;2311.
-
(1999)
J. Vac. Sci. Technol. B
, vol.17
, pp. 2311
-
-
Raajmakers, I.J.1
Sprey, H.2
Storm, A.3
Bergman, T.4
Italiano, J.5
Meyer, D.6
-
12
-
-
0001549520
-
-
Miyano K., Mizushima I., Ohuchi K., Hokazano A., Tsunashima Y. Jpn. J. Appl. Phys. 38:1999;2419.
-
(1999)
Jpn. J. Appl. Phys.
, vol.38
, pp. 2419
-
-
Miyano, K.1
Mizushima, I.2
Ohuchi, K.3
Hokazano, A.4
Tsunashima, Y.5
-
13
-
-
0001115040
-
-
Huang L., Chu J.O., Canaperi D.F., D'Emic C.P., Anderson R.M., Koester S.J., Philip Wong H.S. Appl. Phys. Lett. 78:2002;1267 Huang L., Chu J.O., Goma S.A., D'Emic C.P., Koester S.J., Canaperi D.F., Mooney P.M., Cordes S.A., Speidell J.L., Anderson R.M., Philip Wong H.S. IEEE Trans. Electron. Dev. 49:2002;1566.
-
(2002)
Appl. Phys. Lett.
, vol.78
, pp. 1267
-
-
Huang, L.1
Chu, J.O.2
Canaperi, D.F.3
D'Emic, C.P.4
Anderson, R.M.5
Koester, S.J.6
Philip Wong, H.S.7
-
14
-
-
0036712434
-
-
Huang L., Chu J.O., Canaperi D.F., D'Emic C.P., Anderson R.M., Koester S.J., Philip Wong H.S. Appl. Phys. Lett. 78:2002;1267 Huang L., Chu J.O., Goma S.A., D'Emic C.P., Koester S.J., Canaperi D.F., Mooney P.M., Cordes S.A., Speidell J.L., Anderson R.M., Philip Wong H.S. IEEE Trans. Electron. Dev. 49:2002;1566.
-
(2002)
IEEE Trans. Electron. Dev.
, vol.49
, pp. 1566
-
-
Huang, L.1
Chu, J.O.2
Goma, S.A.3
D'Emic, C.P.4
Koester, S.J.5
Canaperi, D.F.6
Mooney, P.M.7
Cordes, S.A.8
Speidell, J.L.9
Anderson, R.M.10
Philip Wong, H.S.11
-
15
-
-
79955990553
-
-
Mizuno T., Sugiyama N., Tezuka T., Takagi S. Appl. Phys. Lett. 80:2002;601 Tezuka T., Sugiyama N., Takagi S., Kawakubo T. Appl. Phys. Lett. 80:2002;3560.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 601
-
-
Mizuno, T.1
Sugiyama, N.2
Tezuka, T.3
Takagi, S.4
-
16
-
-
79955981936
-
-
Mizuno T., Sugiyama N., Tezuka T., Takagi S. Appl. Phys. Lett. 80:2002;601 Tezuka T., Sugiyama N., Takagi S., Kawakubo T. Appl. Phys. Lett. 80:2002;3560.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 3560
-
-
Tezuka, T.1
Sugiyama, N.2
Takagi, S.3
Kawakubo, T.4
-
18
-
-
0043223975
-
-
M.D. Allendorf, M.L. Hitchman (Eds.), Chemical Vapor Deposition PV 2000-13, Pennington, NJ
-
J. Pejnfors, S.-L. Zhang, J.V. Grahn, M. Östling, T.Winzell, in: M.D. Allendorf, M.L. Hitchman (Eds.), Chemical Vapor Deposition PV 2000-13, Vol. XV. The Electrochemical Society Proceedings Series, Pennington, NJ, 1999, p. 403.
-
(1999)
The Electrochemical Society Proceedings Series
, vol.15
, pp. 403
-
-
Pejnfors, J.1
Zhang, S.-L.2
Grahn, J.V.3
Östling, M.4
Winzell, T.5
-
20
-
-
0042722813
-
-
submitted for publication
-
J.M. Hartmann, A. Abbadie, F. Bertin, G. Rolland, F. Laugier, M.N. Séméria, P. Besson, P. Gentile, J. Crystal Growth, submitted for publication.
-
J. Crystal Growth
-
-
Hartmann, J.M.1
Abbadie, A.2
Bertin, F.3
Rolland, G.4
Laugier, F.5
Séméria, M.N.6
Besson, P.7
Gentile, P.8
-
21
-
-
0034498198
-
-
Besson P., Cowache C., Fabri J.M., Tardif F., Beverina A. Diffusion Defect Data Part B. 76-77:2001;199 P. Besson, C. Cowache, J.M. Fabri, F. Tardif, A. Beverina, in: Proceedings of the Fifth International Symposium on Ultra-Clean Processing of Silicon Surfaces (UCPSS'00), Ostend, Belgium, 2000, p. 199.
-
(2001)
Diffusion Defect Data Part B
, vol.76-77
, pp. 199
-
-
Besson, P.1
Cowache, C.2
Fabri, J.M.3
Tardif, F.4
Beverina, A.5
-
22
-
-
0041721404
-
-
Ostend, Belgium
-
Besson P., Cowache C., Fabri J.M., Tardif F., Beverina A. Diffusion Defect Data Part B. 76-77:2001;199 P. Besson, C. Cowache, J.M. Fabri, F. Tardif, A. Beverina, in: Proceedings of the Fifth International Symposium on Ultra-Clean Processing of Silicon Surfaces (UCPSS'00), Ostend, Belgium, 2000, p. 199.
-
(2000)
Proceedings of the Fifth International Symposium on Ultra-clean Processing of Silicon Surfaces (UCPSS'00)
, pp. 199
-
-
Besson, P.1
Cowache, C.2
Fabri, J.M.3
Tardif, F.4
Beverina, A.5
-
24
-
-
0026896139
-
-
Hsieh T.Y., Jing K.H., Kwon D.L., Koshmieder T.H., Thomspon J.C. J. Electrochem. Soc. 139:1992;1971.
-
(1992)
J. Electrochem. Soc.
, vol.139
, pp. 1971
-
-
Hsieh, T.Y.1
Jing, K.H.2
Kwon, D.L.3
Koshmieder, T.H.4
Thomspon, J.C.5
-
26
-
-
13444306740
-
-
Wang C.L., Unnikrishnan S., Kim B.Y., Kwong D.L., Tasch A.F. Appl. Phys. Lett. 68:1996;108.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 108
-
-
Wang, C.L.1
Unnikrishnan, S.2
Kim, B.Y.3
Kwong, D.L.4
Tasch, A.F.5
-
27
-
-
0030191614
-
-
Wang C.L., Unnikrishnan S., Kim B.Y., Kwong D.L., Tasch A.F. J. Electrochem. Soc. 143:1996;2387.
-
(1996)
J. Electrochem. Soc.
, vol.143
, pp. 2387
-
-
Wang, C.L.1
Unnikrishnan, S.2
Kim, B.Y.3
Kwong, D.L.4
Tasch, A.F.5
-
28
-
-
0032784418
-
-
Caymax M., Decoutere S., Röhr E., Vandervorst W., Heyns M., Sprey H., Storm A., Maes J.-W. Solid State Phenom. 65-66:1999;237.
-
(1999)
Solid State Phenom.
, vol.65-66
, pp. 237
-
-
Caymax, M.1
Decoutere, S.2
Röhr, E.3
Vandervorst, W.4
Heyns, M.5
Sprey, H.6
Storm, A.7
Maes, J.-W.8
-
30
-
-
0027680282
-
-
Vatel O., Verhaverbeke S., Bender H., Caymax M., Chollet F., Vermeire B., Mertens P., André E., Heyns M.M. Jpn. J. Appl. Phys. Part2(32):1993;L1489.
-
(1993)
Jpn. J. Appl. Phys. Part 2
, Issue.32
, pp. 1489
-
-
Vatel, O.1
Verhaverbeke, S.2
Bender, H.3
Caymax, M.4
Chollet, F.5
Vermeire, B.6
Mertens, P.7
André, E.8
Heyns, M.M.9
-
31
-
-
0000161574
-
-
Bender H., Verhaverbeke S., Caymax M., Vatel O., Heyns M.M. J. Appl. Phys. 75:1994;1207.
-
(1994)
J. Appl. Phys.
, vol.75
, pp. 1207
-
-
Bender, H.1
Verhaverbeke, S.2
Caymax, M.3
Vatel, O.4
Heyns, M.M.5
-
32
-
-
0008330122
-
-
Hersam M.C., Guisinger N.P., Lyding J.W., Thompson D.S., Moore J.S. Appl. Phys. Lett. 78:2001;886.
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 886
-
-
Hersam, M.C.1
Guisinger, N.P.2
Lyding, J.W.3
Thompson, D.S.4
Moore, J.S.5
-
33
-
-
0041721409
-
-
Nagoya, Japan, 15-17th January
-
P. Brabant, J. Wen, J. Italiano, T. Landin, N. Cody, L. Haen, in: Poster Presentation during the ISTDM 2003 Conference, Nagoya, Japan, 15-17th January 2003.
-
(2003)
Poster Presentation During the ISTDM 2003 Conference
-
-
Brabant, P.1
Wen, J.2
Italiano, J.3
Landin, T.4
Cody, N.5
Haen, L.6
-
36
-
-
0035449005
-
-
Voigtländer B., Weber T., Šmilauer P., Wolf D.E. Phys. Rev. Lett. 78:1997;2164 Voigtländer B. Surf. Sci. Rep. 43:2001;127.
-
(2001)
Surf. Sci. Rep.
, vol.43
, pp. 127
-
-
Voigtländer, B.1
-
38
-
-
35949011837
-
-
Sinniah K., Sherman M.G., Lewis L.B., Weinberg W.H., Yates J.T. Jr., Janda K.C. Phys. Rev. Lett. 62:1989;567.
-
(1989)
Phys. Rev. Lett.
, vol.62
, pp. 567
-
-
Sinniah, K.1
Sherman, M.G.2
Lewis, L.B.3
Weinberg, W.H.4
Yates J.T., Jr.5
Janda, K.C.6
|