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Volumn 257, Issue 1-2, 2003, Pages 19-30

Growth kinetics of Si on fullsheet, patterned and silicon-on-insulator substrates

Author keywords

A1. Fullsheet; A1. Patterned and SOI wafers; A1. Si growth kinetics; A1. Surface preparation; A3. Reduced pressure chemical vapor deposition

Indexed keywords

CHEMICAL VAPOR DEPOSITION; GROWTH KINETICS; HYDROCHLORIC ACID; SILANES; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS; SUBSTRATES;

EID: 0042009849     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)01380-0     Document Type: Article
Times cited : (47)

References (42)
  • 1
    • 0003253810 scopus 로고    scopus 로고
    • Germanium silicon: Physics and materials
    • R.K. Willadson, WeberE.R. San-Diego: Academic Press
    • Hull R., Bean J.C. Germanium Silicon. physics and materials Willadson R.K., Weber E.R. Semiconductors and Semimetals. Vol. 56:1999;Academic Press, San-Diego.
    • (1999) Semiconductors and Semimetals , vol.56
    • Hull, R.1    Bean, J.C.2
  • 21
    • 0034498198 scopus 로고    scopus 로고
    • Besson P., Cowache C., Fabri J.M., Tardif F., Beverina A. Diffusion Defect Data Part B. 76-77:2001;199 P. Besson, C. Cowache, J.M. Fabri, F. Tardif, A. Beverina, in: Proceedings of the Fifth International Symposium on Ultra-Clean Processing of Silicon Surfaces (UCPSS'00), Ostend, Belgium, 2000, p. 199.
    • (2001) Diffusion Defect Data Part B , vol.76-77 , pp. 199
    • Besson, P.1    Cowache, C.2    Fabri, J.M.3    Tardif, F.4    Beverina, A.5
  • 36
    • 0035449005 scopus 로고    scopus 로고
    • Voigtländer B., Weber T., Šmilauer P., Wolf D.E. Phys. Rev. Lett. 78:1997;2164 Voigtländer B. Surf. Sci. Rep. 43:2001;127.
    • (2001) Surf. Sci. Rep. , vol.43 , pp. 127
    • Voigtländer, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.