Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC

Journal of Physics D: Applied Physics

Volumn 36, Issue 10 A, 2003, Pages

  Dudley, Michael ^a   Huang, XianRong ^a   Vetter, William M ^a  

^a Stony Brook University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTALLINE MATERIALS; DISLOCATIONS (CRYSTALS); SILICON CARBIDE; THIN FILMS;

BACK-REFLECTION TOPOGRAPHY; HIGH RESOLUTION X-RAY DIFFRACTION; LATTICE MISMATCH; RETICULOGRAPHY; SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY; TRANSMISSION TOPOGRAPHY;

X RAY CRYSTALLOGRAPHY;

EID: 0038387407     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/10A/307     Document Type: Article

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