Reticulography: A simple and sensitive technique for mapping misorientations in single crystals

Journal of Synchrotron Radiation

Volumn 3, Issue 6, 1996, Pages 313-315

  Lang, A R ^a   Makepeace, A P W ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

Bragg plane misorientation mapping; Crystal perfection assessment; X ray topography

Indexed keywords

EID: 0030513805     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049596010515     Document Type: Article

References (1)

1. Lang, A. R. (1994). J. Appl. Cryst. 27, 988-1001.