Surface-relaxation contributions to axial screw dislocation contrast in synchrotron white-beam X-ray topographs of SiC

Journal of Applied Crystallography

Volumn 35, Issue 6, 2002, Pages 689-695

  Vetter, W M ^a   Dudley, M ^a  

^a Stony Brook University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON CARBIDE;

ARTICLE; CRYSTALLOGRAPHY; DIFFRACTION; IMAGE ANALYSIS; MODEL; PREDICTION; SIMULATION; SYNCHROTRON; X RAY;

EID: 0036895811     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889802016175     Document Type: Article

References (15)

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