Superscrew dislocation contrast on synchrotron white-beam topographs: An accurate description of the direct dislocation image

Journal of Applied Crystallography

Volumn 32, Issue 3, 1999, Pages 516-524

  Huang, X R ^a   Dudley, M ^a   Vetter, W M ^a   Huang, W ^a   Si, W ^a   Carter Jr , C H ^b  

^a Stony Brook University   (United States)

^b Arkansas Power Electronics International Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000176628     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899002939     Document Type: Article

References (12)

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4. Dudley, M., Huang, X. R. & Huang, W. (1998). Presentation at XTOP'98, Durham, UK. To be published in J. Phys. D.
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10. Vetter, W. M. & Dudley, M. (1998). J. Appl. Cryst. 31, 820-822.
11. Wang, S. (1995). PhD thesis, State University of New York at Stony Brook.
12. Zontone, F., Mancini, L., Barrett, R., Baruchel, J., Härtwig, J. & Epelboin, Y. (1996). J. Synchrotron Rad. 3, 173-184.