Dependence of the direct dislocation image on sample-to-film distance in X-ray topography

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 357, Issue 1761, 1999, Pages 2659-2670

  Huang, X R ^a   Dudley, M ^a   Zhao, J Y ^a   Raghothamachar, B ^a  

^a Stony Brook University   (United States)

Author keywords

Back reflection; Dislocation image; Imaging distance; Superscrew dislocation; X ray topography

Indexed keywords

EID: 0347138190     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.1999.0455     Document Type: Article

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