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Volumn 67, Issue 4, 2003, Pages

Vibrational modes and electronic properties of nitrogen defects in silicon

Author keywords

[No Author keywords available]

Indexed keywords

NITROGEN; SILICON;

EID: 0037438608     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.045206     Document Type: Article
Times cited : (104)

References (94)
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    • Substitutional and interstitial oxygen in silicon have principal piezospectroscopic stress tensor elements of 8.8 and (formula presented) per unit strain, respectively. See Ref., and references therein
    • Substitutional and interstitial oxygen in silicon have principal piezospectroscopic stress tensor elements of 8.8 and (formula presented) per unit strain, respectively. See Ref. 51, and references therein.
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    • This expression neglects all but configurational entropic terms
    • This expression neglects all but configurational entropic terms.
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    • Applying equilibrium conditions, the concentration of vacancies at lower temperatures will be reduced and the relative concentration of (formula presented) redecuded commensurately
    • Applying equilibrium conditions, the concentration of vacancies at lower temperatures will be reduced and the relative concentration of (formula presented) redecuded commensurately.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.