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Volumn 93, Issue 5, 2003, Pages 2528-2535

Micro-Raman and ultraviolet ellipsometry studies on μc-Si:H films prepared by H2 dilution to the Ar-assisted SiH4 plasma in radio frequency glow discharge

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CRYSTAL DEFECTS; CRYSTALLIZATION; ELLIPSOMETRY; GLOW DISCHARGES; GRAIN GROWTH; HYDROGEN; PLASMAS; RAMAN SCATTERING; ULTRAVIOLET SPECTROSCOPY;

EID: 0037350846     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1539292     Document Type: Article
Times cited : (48)

References (47)
  • 4
    • 0000608997 scopus 로고
    • Scitec, Switzerland
    • D. Das, Solid State Phenomena (Scitec, Switzerland, 1995), Vols. 44-46, pp. 227-258.
    • (1995) Solid State Phenomena , vol.44-46 , pp. 227-258
    • Das, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.