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Volumn 42, Issue SPEC., 2003, Pages

Simple model for 1/f noise in polycrystalline silicon thin-film transistors

Author keywords

1 f noise; Mobility fluctuation; Polycrystalline silicon; Thermal activation; Thin film transistors

Indexed keywords


EID: 0037305507     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.