On 1/fγ noise in semiconductor devices

Solid-State Electronics

Volumn 43, Issue 12, 1999, Pages 2181-2183

  Lee, J I ^a   Brini, J ^a   Chovet, A ^a   Dimitriadis, C A ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CURRENTS; THERMAL EFFECTS;

THERMAL ACTIVATION MODEL;

SEMICONDUCTOR DEVICES;

EID: 0033284260     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(99)00186-0     Document Type: Article

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