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Journal of Applied Physics

Volumn 83, Issue 3, 1998, Pages 1469-1475

Conduction and low-frequency noise in high temperature processed polycrystalline silicon thin film transistors

(5) Dimitriadis, C A a Brini, J b Kamarinos, G b Gueorguiev, V K c Ivanov, Tz E c

a ARISTOTLE UNIVERSITY OF THESSALONIKI (Greece)

b Grenoble INP Phelma (France)

c INSTITUTE OF SOLID STATE PHYSICS (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001520577 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.366852 Document Type: Article

Times cited : (22)

References (16)

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