-
1
-
-
0002570448
-
Recent progress in SiC crystal growth
-
Silicon Carbide and Related Materials
-
V. F. Tsetkov, S. T. Allen, H. S. Kong, and C. H. Carter, Jr., "Recent progress in SiC crystal growth," Silicon Carbide and Related Materials, Inst. of Phys. Conf. Series, no. 142, p. 17, 1996.
-
(1996)
Inst. of Phys. Conf. Series
, vol.142
, pp. 17
-
-
Tsetkov, V.F.1
Allen, S.T.2
Kong, H.S.3
Carter Jr., C.H.4
-
2
-
-
0042746986
-
Progress in SiC epitaxy - Present and future
-
Silicon Carbide and Related Materials
-
H. Matsunami, "Progress in SiC epitaxy - Present and future," Silicon Carbide and Related Materials, Inst. of Phys. Conf. Series, no. 137, p. 45, 1994.
-
(1994)
Inst. of Phys. Conf. Series
, vol.137
, pp. 45
-
-
Matsunami, H.1
-
3
-
-
51249162005
-
Progress in silicon carbide semiconductor electronics technology
-
P. G. Neudeck, "Progress in silicon carbide semiconductor electronics technology," J. Electron. Mater., vol. 24, p. 283, 1995.
-
(1995)
J. Electron. Mater.
, vol.24
, pp. 283
-
-
Neudeck, P.G.1
-
4
-
-
0027558366
-
Comparision of 6H-SiC, 3C-SiC and Si for power devices
-
Mar.
-
M. Bhatnagar and B. J. Baliga, "Comparision of 6H-SiC, 3C-SiC and Si for power devices," IEEE Trans. Electron Devices, vol. 40, p. 645, Mar. 1993.
-
(1993)
IEEE Trans. Electron Devices
, vol.40
, pp. 645
-
-
Bhatnagar, M.1
Baliga, B.J.2
-
5
-
-
0030107490
-
Excellent reverse blocking characteristics of high-voltage 4H-SiC rectifiers with boron-implanted edge termination
-
Mar.
-
A. Itoh, T. Kimoto, and H. Matsunami, "Excellent reverse blocking characteristics of high-voltage 4H-SiC rectifiers with boron-implanted edge termination," IEEE Electron Device Lett., vol. 17, p. 139, Mar. 1996.
-
(1996)
IEEE Electron Device Lett.
, vol.17
, pp. 139
-
-
Itoh, A.1
Kimoto, T.2
Matsunami, H.3
-
6
-
-
0028531328
-
A simple edge termination for silicon carbide devices with nearly ideal breakdown voltage
-
Oct.
-
D. Alok, B. J. Baliga, and P. K. McLarty, "A simple edge termination for silicon carbide devices with nearly ideal breakdown voltage," IEEE Electron Device Lett., vol. 14, p. 394, Oct. 1994.
-
(1994)
IEEE Electron Device Lett.
, vol.14
, pp. 394
-
-
Alok, D.1
Baliga, B.J.2
McLarty, P.K.3
-
7
-
-
0008966543
-
Vertical power devices in silicon carbide
-
Silicon Carbide and Related Materials
-
J. W. Palmour, J. A. Edmond, H. S. Kong, and C. H. Carter, Jr., "Vertical power devices in silicon carbide," Silicon Carbide and Related Materials, Inst. of Phys. Conf. Series, no. 137, p. 499, 1994.
-
(1994)
Inst. of Phys. Conf. Series
, vol.137
, pp. 499
-
-
Palmour, J.W.1
Edmond, J.A.2
Kong, H.S.3
Carter Jr., C.H.4
-
8
-
-
0029722951
-
A fully planarized 6H-SiC UMOS insulated-gate bipolar-transistor
-
Univ. California, Santa Barbara, CA, June 24-26
-
N. Ramungul, T. P. Chow, M. Ghezzo, J. Kretchmer, and W. Hennessy, "A fully planarized 6H-SiC UMOS insulated-gate bipolar-transistor," presented at the 54th Annu. Dev. Res. Conf., Univ. California, Santa Barbara, CA, June 24-26, 1996.
-
(1996)
54th Annu. Dev. Res. Conf.
-
-
Ramungul, N.1
Chow, T.P.2
Ghezzo, M.3
Kretchmer, J.4
Hennessy, W.5
-
9
-
-
0000004718
-
2 interface
-
2 interface," J. Appl. Phys., vol. 79, p. 3042, 1996.
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 3042
-
-
Shenoy, J.N.1
Das, M.K.2
Cooper Jr., J.A.3
Melloch, M.R.4
Palmour, J.W.5
-
10
-
-
3743140438
-
DIMOS - A novel IC technology wih submicron effective channel MOSFETs
-
J. Tihanyi and D. Widmann, "DIMOS - A novel IC technology wih submicron effective channel MOSFETs," in IEDM Tech. Dig., 1977, p. 399.
-
(1977)
IEDM Tech. Dig.
, pp. 399
-
-
Tihanyi, J.1
Widmann, D.2
-
11
-
-
36449003822
-
Empirical depth profile simulator for ion implantation in 6H alpha-SiC
-
S. Ahmed, C. J. Barbero, T. W. Sigmon, and J. Erikson, "Empirical depth profile simulator for ion implantation in 6H alpha-SiC," J. Appl. Phys., vol. 77, p. 6194, 1995.
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 6194
-
-
Ahmed, S.1
Barbero, C.J.2
Sigmon, T.W.3
Erikson, J.4
-
13
-
-
0001519118
-
Electrical properties of silicon carbide polytypes
-
Silicon Carbide and Related Materials
-
G. Pensl, V. V. Atanas'ev, M. Bassler, M. Schadt, T. Troffer, J. Heindl, H. P. Strunk, M. Maier, and W. J. Choyke, "Electrical properties of silicon carbide polytypes," Silicon Carbide and Related Materials, Inst. of Phys. Conf. Series, no. 142, p. 17, 1996.
-
(1996)
Inst. of Phys. Conf. Series
, vol.142
, pp. 17
-
-
Pensl, G.1
Atanas'ev, V.V.2
Bassler, M.3
Schadt, M.4
Troffer, T.5
Heindl, J.6
Strunk, H.P.7
Maier, M.8
Choyke, W.J.9
-
14
-
-
51249162328
-
2 metal-oxide-semiconductor interface
-
2 metal-oxide-semiconductor interface," J. Electron. Mater., vol. 24, p. 303, 1995.
-
(1995)
J. Electron. Mater.
, vol.24
, pp. 303
-
-
Shenoy, J.N.1
Chindalore, G.L.2
Melloch, M.R.3
Cooper Jr., J.A.4
Palmour, J.W.5
Irvine, K.G.6
-
15
-
-
0000088192
-
2/6H-SiC metal-oxide-semiconductor devices
-
2/6H-SiC metal-oxide-semiconductor devices," Appl. Phys. Lett., vol. 68, p. 2231, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2231
-
-
Xie, W.1
Shenoy, J.N.2
Sheppard, S.T.3
Cooper Jr., J.A.4
Melloch, M.R.5
-
16
-
-
0018985713
-
Modeling of the on-resistance of LDMOS, VDMOS, and VMOS power transistors
-
Feb.
-
S. C. Sun and J. D. Plummer, "Modeling of the on-resistance of LDMOS, VDMOS, and VMOS power transistors," IEEE Trans. Electron Devices, vol. ED-27, p. 356, Feb. 1980.
-
(1980)
IEEE Trans. Electron Devices
, vol.ED-27
, pp. 356
-
-
Sun, S.C.1
Plummer, J.D.2
-
17
-
-
0028732473
-
Conductivity anisotropy in epitaxial 6H- and 4H-SiC
-
W. J. Schaffer, G. H Negley, K. G. Irvine, and J. W. Palmour, "Conductivity anisotropy in epitaxial 6H- and 4H-SiC," in Proc. Mater. Res. Soc. Symp., 1994, vol. 339, p. 595.
-
(1994)
Proc. Mater. Res. Soc. Symp.
, vol.339
, pp. 595
-
-
Schaffer, W.J.1
Negley, G.H.2
Irvine, K.G.3
Palmour, J.W.4
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