메뉴 건너뛰기




Volumn 18, Issue 3, 1997, Pages 93-95

High-voltage double-implanted power MOSFET's in 6H-SiC

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CALCULATIONS; COMPUTER SIMULATION; ION IMPLANTATION; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DOPING; SEMICONDUCTOR JUNCTIONS; SILICON CARBIDE;

EID: 0031103557     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.556091     Document Type: Article
Times cited : (227)

References (17)
  • 1
    • 0002570448 scopus 로고    scopus 로고
    • Recent progress in SiC crystal growth
    • Silicon Carbide and Related Materials
    • V. F. Tsetkov, S. T. Allen, H. S. Kong, and C. H. Carter, Jr., "Recent progress in SiC crystal growth," Silicon Carbide and Related Materials, Inst. of Phys. Conf. Series, no. 142, p. 17, 1996.
    • (1996) Inst. of Phys. Conf. Series , vol.142 , pp. 17
    • Tsetkov, V.F.1    Allen, S.T.2    Kong, H.S.3    Carter Jr., C.H.4
  • 2
    • 0042746986 scopus 로고
    • Progress in SiC epitaxy - Present and future
    • Silicon Carbide and Related Materials
    • H. Matsunami, "Progress in SiC epitaxy - Present and future," Silicon Carbide and Related Materials, Inst. of Phys. Conf. Series, no. 137, p. 45, 1994.
    • (1994) Inst. of Phys. Conf. Series , vol.137 , pp. 45
    • Matsunami, H.1
  • 3
    • 51249162005 scopus 로고
    • Progress in silicon carbide semiconductor electronics technology
    • P. G. Neudeck, "Progress in silicon carbide semiconductor electronics technology," J. Electron. Mater., vol. 24, p. 283, 1995.
    • (1995) J. Electron. Mater. , vol.24 , pp. 283
    • Neudeck, P.G.1
  • 4
    • 0027558366 scopus 로고
    • Comparision of 6H-SiC, 3C-SiC and Si for power devices
    • Mar.
    • M. Bhatnagar and B. J. Baliga, "Comparision of 6H-SiC, 3C-SiC and Si for power devices," IEEE Trans. Electron Devices, vol. 40, p. 645, Mar. 1993.
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 645
    • Bhatnagar, M.1    Baliga, B.J.2
  • 5
    • 0030107490 scopus 로고    scopus 로고
    • Excellent reverse blocking characteristics of high-voltage 4H-SiC rectifiers with boron-implanted edge termination
    • Mar.
    • A. Itoh, T. Kimoto, and H. Matsunami, "Excellent reverse blocking characteristics of high-voltage 4H-SiC rectifiers with boron-implanted edge termination," IEEE Electron Device Lett., vol. 17, p. 139, Mar. 1996.
    • (1996) IEEE Electron Device Lett. , vol.17 , pp. 139
    • Itoh, A.1    Kimoto, T.2    Matsunami, H.3
  • 6
    • 0028531328 scopus 로고
    • A simple edge termination for silicon carbide devices with nearly ideal breakdown voltage
    • Oct.
    • D. Alok, B. J. Baliga, and P. K. McLarty, "A simple edge termination for silicon carbide devices with nearly ideal breakdown voltage," IEEE Electron Device Lett., vol. 14, p. 394, Oct. 1994.
    • (1994) IEEE Electron Device Lett. , vol.14 , pp. 394
    • Alok, D.1    Baliga, B.J.2    McLarty, P.K.3
  • 7
    • 0008966543 scopus 로고
    • Vertical power devices in silicon carbide
    • Silicon Carbide and Related Materials
    • J. W. Palmour, J. A. Edmond, H. S. Kong, and C. H. Carter, Jr., "Vertical power devices in silicon carbide," Silicon Carbide and Related Materials, Inst. of Phys. Conf. Series, no. 137, p. 499, 1994.
    • (1994) Inst. of Phys. Conf. Series , vol.137 , pp. 499
    • Palmour, J.W.1    Edmond, J.A.2    Kong, H.S.3    Carter Jr., C.H.4
  • 8
    • 0029722951 scopus 로고    scopus 로고
    • A fully planarized 6H-SiC UMOS insulated-gate bipolar-transistor
    • Univ. California, Santa Barbara, CA, June 24-26
    • N. Ramungul, T. P. Chow, M. Ghezzo, J. Kretchmer, and W. Hennessy, "A fully planarized 6H-SiC UMOS insulated-gate bipolar-transistor," presented at the 54th Annu. Dev. Res. Conf., Univ. California, Santa Barbara, CA, June 24-26, 1996.
    • (1996) 54th Annu. Dev. Res. Conf.
    • Ramungul, N.1    Chow, T.P.2    Ghezzo, M.3    Kretchmer, J.4    Hennessy, W.5
  • 10
    • 3743140438 scopus 로고
    • DIMOS - A novel IC technology wih submicron effective channel MOSFETs
    • J. Tihanyi and D. Widmann, "DIMOS - A novel IC technology wih submicron effective channel MOSFETs," in IEDM Tech. Dig., 1977, p. 399.
    • (1977) IEDM Tech. Dig. , pp. 399
    • Tihanyi, J.1    Widmann, D.2
  • 11
    • 36449003822 scopus 로고
    • Empirical depth profile simulator for ion implantation in 6H alpha-SiC
    • S. Ahmed, C. J. Barbero, T. W. Sigmon, and J. Erikson, "Empirical depth profile simulator for ion implantation in 6H alpha-SiC," J. Appl. Phys., vol. 77, p. 6194, 1995.
    • (1995) J. Appl. Phys. , vol.77 , pp. 6194
    • Ahmed, S.1    Barbero, C.J.2    Sigmon, T.W.3    Erikson, J.4
  • 16
    • 0018985713 scopus 로고
    • Modeling of the on-resistance of LDMOS, VDMOS, and VMOS power transistors
    • Feb.
    • S. C. Sun and J. D. Plummer, "Modeling of the on-resistance of LDMOS, VDMOS, and VMOS power transistors," IEEE Trans. Electron Devices, vol. ED-27, p. 356, Feb. 1980.
    • (1980) IEEE Trans. Electron Devices , vol.ED-27 , pp. 356
    • Sun, S.C.1    Plummer, J.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.