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Volumn 89, Issue 10, 2001, Pages 5533-5542

Fermi level position at metal Si1-x-yGexCy interfaces

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035872967     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1365943     Document Type: Article
Times cited : (8)

References (59)
  • 38
    • 0005450976 scopus 로고    scopus 로고
    • Microscopy of semiconducting materials
    • edited by A. Cullis and J. Hutchison Institute of Physics Publishing, Bristol
    • K. Lyutovich, F. Ernst, F. Banhart, I. Silier, M. Konuma, Microscopy of Semiconducting Materials, Inst. Phys. Conf. Series 157, edited by A. Cullis and J. Hutchison (Institute of Physics Publishing, Bristol, 1997). p. 131.
    • (1997) Inst. Phys. Conf. Series , vol.157 , pp. 131
    • Lyutovich, K.1    Ernst, F.2    Banhart, F.3    Silier, I.4    Konuma, M.5
  • 48
    • 1142267920 scopus 로고    scopus 로고
    • H. J. Osten, J. Appl. Phys. 84, 2716 (1998); S. Galdin, P. Dollfus, V. Aubry-Fortuna, P. Hesto, and H. J. Osten, Solid State Commun. 15, 1 (2000).
    • (1998) J. Appl. Phys. , vol.84 , pp. 2716
    • Osten, H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.