Electrical properties of metal/Si1-xGex/Si(100) heterojunctions

Applied Surface Science

Volumn 100-101, Issue , 1996, Pages 526-529

  Shinoda, H ^a   Kosaka, M ^a   Kojima, J ^a   Ikeda, H ^a   Zaima, S ^a   Yasuda, Y ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONTACTS; ELECTRIC PROPERTIES; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; ZIRCONIUM;

CONTACT RESISTIVITY; SCHOTTKY BARRIER HEIGHTS; SILICON GERMANIDE;

HETEROJUNCTIONS;

EID: 0030564361     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(96)00333-9     Document Type: Article

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