Cosmic ray neutron multiple-upset measurements in a 0.6-μm CMOS process

IEEE Transactions on Nuclear Science

Volumn 47, Issue 6 III, 2000, Pages 2595-2602

  Hazucha, Peter ^b   Svensson, Christer ^a,b  

^a IEEE   (Sweden)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

Circuit reliability; Multiple bit upset; Single event upset; Soft error rate; Technology characterization

Indexed keywords

AIRPLANE FLIGHT ALTITUDES; MULTIPLE BIT UPSET; SINGLE EVENT UPSET; SOFT ERROR RATE;

AIRCRAFT; CMOS INTEGRATED CIRCUITS; COSMIC RAY MEASUREMENT; ELECTRIC CHARGE; ELECTRIC POTENTIAL; ERROR CORRECTION; FLIGHT DYNAMICS; MOSFET DEVICES; RELIABILITY;

NEUTRON BEAMS;

EID: 0034451096     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.903814     Document Type: Conference Paper

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