Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1996, Pages 1-6

  McKee, W R ^a   McAdams, H P ^a   Smith, E B ^a   McPherson, J W ^a   Janzen, J W ^a   Ondrusek, J C ^a   Hyslop, A E ^a   Russell, D E ^a   Coy, R A ^a   Bergman, D W ^a   Nguyen, N Q ^a   Aton, T J ^a   Block, L W ^a   Huynh, V C ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; COSMIC RAYS; ERRORS; MATHEMATICAL MODELS; NEUTRONS; RADIATION EFFECTS;

COSMIC RAY NEUTRON FLUX; CRITICAL CHARGE; DYNAMIC RANDOM ACCESS MEMORY; SOFT ERROR RATE;

RANDOM ACCESS STORAGE;

EID: 0029718244     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1996.492052     Document Type: Conference Paper

References (9)