Analysis of single event effects at grazing angle

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 528-536

  Campbell, A B ^a   Musseau, O ^a   Ferlet Cavrois, V ^a   Stapor, W J ^a   McDonald, P T ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; CMOS INTEGRATED CIRCUITS; COSMIC RAYS; DOSIMETRY; HEAVY IONS; PARTICLE ACCELERATORS; RANDOM ACCESS STORAGE;

CHARGE COLLECTION; DIELECTRIC ISOLATION TECHNOLOGY; LINEAR ENERGY TRANSFER; MULTIPLE BIT UPSET; SINGLE EVENT EFFECTS;

RADIATION EFFECTS;

EID: 0031624604     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)