Microdosimetry code simulation of charge-deposition spectra, single-event upsets and multiple-bit upsets

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1486-1493

  Dyer, C S ^a   Comber, C ^a   Truscott, P R ^a   Sanderson, C ^a   Underwood, C ^a   Oldfield, M ^a   Campbell, A ^a   Buchner, S ^a   Meehan, T ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRONS; ION BOMBARDMENT; MONTE CARLO METHODS; NEUTRONS; PROTON IRRADIATION; RADIATION SHIELDING; SPACECRAFT;

HIGH ENERGY TRANSPORT CODE; ION MICRODOSIMETRY CODE EXTENSION; LIGHT HEAVY ION;

DOSIMETRY;

EID: 0033345356     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819112     Document Type: Article

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