Measurements and analysis of neutron-reactioninduced charges in a silicon surface region

IEEE Transactions on Nuclear Science

Volumn 44, Issue 2, 1997, Pages 173-178

  Tosaka, Y ^a,b   Satoh, S ^a   Suzuki, K ^a   Sugii, T ^a   Nakayama, N ^a   Ehara, H ^a   Woffinden, G A ^a   Wender, S A ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

^b Amdahl Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CHARGE; ELECTRIC CHARGE MEASUREMENT; NEUTRON IRRADIATION;

CHARGE COLLECTION; NEUTRON REACTION INDUCED CHARGES;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0031125059     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.568799     Document Type: Article

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