Neutron induced single-word multiple-bit upset in SRAM

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1427-1433

  Johansson, K ^a   Ohlsson, M ^a   Olsson, N ^a   Blomgren, J ^a   Renberg, P U ^a  

^a SAAB AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRON ENERGY LEVELS; FREQUENCIES; NEUTRON IRRADIATION; RANDOM ACCESS STORAGE;

NEUTRON ENERGY; SINGLE WORD MULTIPLE BIT UPSET; STATIC RANDOM ACCESS MEMORY;

RADIATION EFFECTS;

EID: 0033324767     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819103     Document Type: Article

References (14)

1. E. Normand, "Single-event Upset at Ground Level", IEEE Transactions on Nuclear Science, vol.43, pp.2742.
2. T.J.O'Gorman "The effect of cosmic rays on soft error rate of DRAM at ground level", IEEE Transactions on Electronic Devices, vol.41, pp. 553-557,1994.
3. K. Johansson, P. Dyreklev, B. Granbom, M-C. Calvet, S. Fourtine and O. Feuillatre, "In-Flight and Ground Testing of Single-Event Upset Sensitivity in Static RAMs", IEEE Transactions on Nuclear Science.
4. J. Olsen, P.E. Becher, P.B, Fynbo, P. Raaby and J. Schultz "Neutron-Induced Single-Event upset in Static RAMs Observed at 10km Flight Altitude", IEEE Transactions on Nuclear Science, vol.40, pp.74-77,1993.
5. N. Kerness and A. Taber "Neutron SEU Trends in Avionics",1997 IEEE Radiation Effects Data Workshop Record.
6. E. Normand "Single-event Effects in Avionics", IEEE Transactions on Nuclear Science, vol.43, pp.461-473,1996.
7. B. J. Lewis "Measurement of neutron radiation exposure of commercial airline pilots using bubble detectors", Nuclear Technology, vol.106,1994.
8. D. Schalch, "In-flight measurements at high latitudes of fast neutron doses to aircrew", Radiation Protection Dosimetry, vol.48,1993.
9. J. R. Letaw and E. Normand "Guidelines for predicting single-event upset in neutron environments", IEEE Transactions on Nuclear Science.
10. G.I. Underwood and M.K. Oldfield "Observed Radiation -Induced Degradation of Commercial-Off-The-Shelf (COTS) Devices Operating in Low-Earth Orbit'', IEEE Transactions on Nuclear Science.
11. R. Koga, S.D. Pinkerton, T.J. Lie and K.B. Crawford "Single-word Multiple-bit Upsets in Static Random Access Devices" IEEE Transactions on Nuclear Science.
12. K. Johansson, P. Dyreklev, B. Granbom, N. Olsson, J. Blomgren and P-U. Renberg "Energy Resolved Neutron SEU Measurements from 22 to 160 MeV", IEEE Transactions on Nuclear Science.
13. H. Condé, S. Hultqvist, N.Olsson, T. Rönnqvist, R. Zorro, J. Blomgren, G. Tibell, A. Hâkansson, OJonsson, A. Lindholm, L. Nilsson, P-U. Renberg, A. Brockstedt, P. Ekström, M. Österlund, F.P. Brady and Z. Szeflinski, "A facility for studies of neutron-induced reactions in the 50-200MeV range ", Nuclear Instruments and Methods in Physics Research, vol.A292, pp.121-128,1990.
14. M. Ohlsson, P. Dyreklev, K. Johansson and P. Alfke, "Neutron Single Event Upsets in SRAM-based FPGAs",1998 IEEE Radiation Effects Data Workshop flecoraf.