Neutron-induced soft error simulator and its accurate predictions

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Volumn , Issue , 1997, Pages 253-256

  Tosaka, Y ^a   Satoh, S ^a   Itakura, T ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COSMIC RAYS; DATABASE SYSTEMS; ERRORS; MOLECULAR DYNAMICS; NEUTRONS;

ANTISYMMETRIZED MOLECULAR DYNAMICS; NEUTRON INDUCED SOFT ERROR SIMULATOR; SOFT ERRORS;

COMPUTER SIMULATION;

EID: 0030719569     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)