DFT for digital detection of analog parametric faults in SC filters

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 7, 2000, Pages 789-798

  Vinnakota, Bapiraju ^a   Harjani, Ramesh ^a  

^a University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC NETWORK PARAMETERS; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; LINEAR INTEGRATED CIRCUITS; LINEAR NETWORK ANALYSIS; SWITCHED FILTERS; TRANSFER FUNCTIONS;

ANALOG CIRCUIT; ANALOG PARAMETRIC FAULTS; DIGITAL DETECTION; SWITCHED CAPACITOR FILTERS;

DESIGN FOR TESTABILITY;

EID: 0034229269     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.851994     Document Type: Article

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