Oscillation-test strategy for analog and mixed-signal integrated circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 476-482

  Arabi, Karim ^a   Kaminska, Bozena ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CIRCUIT OSCILLATIONS; ELECTRIC CONVERTERS; ERROR DETECTION; FAILURE ANALYSIS; LINEAR INTEGRATED CIRCUITS; MULTIPLEXING EQUIPMENT; OPERATIONAL AMPLIFIERS;

ANALOG INTEGRATED CIRCUITS; ANALOG MULTIPLEXERS; BOUNDARY SCAN; MIXED SIGNAL INTEGRATED CIRCUITS; OSCILLATION FREQUENCIES; OSCILLATION TESTS; TESTABILITY;

INTEGRATED CIRCUIT TESTING;

EID: 0029721649     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)