Optimal test set design for analog circuits

1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers

Volumn , Issue , 1990, Pages 294-297

  Milor, Linda ^a   Sangiovanni Vincentelli, Alberto ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS;

ANALOG CIRCUITS; FAULT DETECTION;

INTEGRATED CIRCUIT TESTING;

EID: 0025532049     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)